KOMATSU DENSHI KINZOKU KABUSHIKI KAISHA

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Patent Activity in the Last 10 Years

Technologies

Intl Class Technology Matters Rank in Class
 
  
 
C30B SINGLE-CRYSTAL GROWTH 1442
 
  
 
B08B CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL 157
 
  
 
G06K RECOGNITION OF DATA; PRESENTATION OF DATA; RECORD CARRIERS; HANDLING RECORD CARRIERS 1197
 
  
 
H01L SEMICONDUCTOR DEVICES; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR 1361

Top Patents (by citation)

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Recent Publications

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Recent Patents

Patent # Title Filing Date Issue Date Intl Class
8246744 Method for predicting precipitation behavior of oxygen in silicon single crystal, method for determining production parameter of silicon single crystal, and storage medium for storing program for predicting precipitation behavior of oxygen in silicon single crystalJan 27, 05Aug 21, 12[C30B]
8080113 Method and apparatus for collecting chemicals from semiconductor waferFeb 04, 10Dec 20, 11[B08B]
8002893 Apparatus for pulling single crystal by CZ methodDec 23, 08Aug 23, 11[C30B]
7244309 Apparatus for pulling single crystal by CZ methodJun 07, 05Jul 17, 07[C30B]
7235128 Process for producing single-crystal semiconductor and apparatus for producing single-crystal semiconductorDec 06, 04Jun 26, 07[C30B]
7160386 Single crystal semiconductor manufacturing apparatus and manufacturing method, and single crystal ingotSep 27, 02Jan 09, 07[C30B]
7147710 Method of manufacturing epitaxial silicon waferNov 18, 02Dec 12, 06[C30B]
7141113 Production method for silicon single crystal and production device for single crystal ingot, and heat treating method for silicon crystal waferNov 19, 99Nov 28, 06[C30B]
6994748 Method and apparatus for measuring melt levelMay 01, 01Feb 07, 06[C30B]
6977010 Apparatus for pulling single crystal by CZ methodJan 07, 03Dec 20, 05[C30B]

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Expired/Abandoned/Withdrawn Patents

Patent # Title Status Filing Date Issue/Pub Date Intl Class
2009/0170,292 Method for producing semiconductor substrate and semiconductor substrateAbandonedJul 27, 05Jul 02, 09[H01L]
2008/0311,019 Apparatus for pulling single crystal by CZ methodAbandonedOct 31, 07Dec 18, 08[C01B, H01L]
2008/0311,021 Apparatus for pulling single crystal by CZ methodAbandonedOct 31, 07Dec 18, 08[C01B, C30B]
2008/0302,295 Method of Evaluating Quality of Silicon Single CrystalAbandonedAug 01, 05Dec 11, 08[C30B]
2007/0184,662 Double-side polishing carrier and fabrication method thereofAbandonedJun 23, 05Aug 09, 07[C03C, H01L, B44C]
2007/0140,828 Silicon wafer and method for production of silicon waferAbandonedDec 18, 02Jun 21, 07[B65D]
2006/0226,514 Semiconductor epitaxial waferAbandonedMar 25, 04Oct 12, 06[H01L]
2006/0016,387 Silicon wafer, its manufacturing method, and its manufacturing apparatusAbandonedNov 14, 03Jan 26, 06[C30B]
2004/0065,250 Epitaxial silicon waferAbandonedOct 03, 03Apr 08, 04[C30B]

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